ASTM F1893测量半导体器件电离剂量率熔蚀指南
日期:2012-02-08 13:45
for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
E1894 Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
F526 Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
Index Terms
burnout; failure; high dose-rate; integrated circuits; ionizing radiation; latchup; microcircuits; semiconductor devices; survivability;
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