ASTM F1893测量半导体器件电离剂量率熔蚀指南
日期:2012-02-08 13:45
destructive, the minimum dose-rate burnout failure level must be determined statistically.
1. Scope
1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their hi
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