ASTM F1893测量半导体器件电离剂量率熔蚀指南
日期:2012-02-08 13:45
ASTM F1893Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
ASTM F1893测量半导体器件电离剂量率熔蚀指南
The use of FXR or LINAC radiation sources for the determination of high dose-rate burnout in semiconductor devices is addressed in this guide. The goal of this guide is to provide a systematic approach to testing semiconductor devices for burnout or survivability.
The different types of failure modes that are possible are defined and discussed in t
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