ASTM F1689测定薄膜开关绝缘电阻的标准试验方法
日期:2012-02-08 13:41
ASTM F1689Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
ASTM F1689测定薄膜开关绝缘电阻的标准试验方法
Insulation resistance is useful for design verification, quality control of materials, and workmanship.
Low insulation resistance can cause high leakage currents.
High leakage currents can lead to deterioration of the insulation or false triggering of the associated input device, or both.
Specific areas of testing are, but not limited to:
3.4.1 Conductor/di
1/3 下一页 上一页 首页 尾页
返回
刷新
WAP首页
网页?/a>
登录
11/06 10:47